发明名称 Method for testing electrical modules
摘要 For speeding up the short-circuit and component test phase when testing electrical modules on a flying probe tester that includes contacting elements movable in all directions over a respective line networks of the electrical module, it is proposed that, at the beginning of the testing phase, such groups of contact points be contacted. Further, a respective line network-to-ground/potential connection for respective measurement threat is produced with respect to all line networks occurring on the electrical module under test.
申请公布号 US6456089(B1) 申请公布日期 2002.09.24
申请号 US20000530176 申请日期 2000.04.25
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 VUKSIC ANTUN
分类号 G01R31/28;(IPC1-7):H01H31/02;G01R31/08 主分类号 G01R31/28
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