发明名称 System and method for calibrating semiconductor processing equipment
摘要 A system for measuring the rotational speed of a shaft driven by a motor. The system includes a rotation measurement device having a rotatable sensor and configured to generate a signal corresponding to rotation of the sensor. The rotation measurement device may be supported by a fixture mountable on the motor. A coupler is associated with the sensor and includes a gripping surface configured to contact and grip the end-surface of the shaft to couple the sensor to the shaft and impart the rotation of the shaft to the sensor.
申请公布号 US6453742(B1) 申请公布日期 2002.09.24
申请号 US20000585892 申请日期 2000.05.31
申请人 SEH AMERICA, INC. 发明人 WHITE BARTON V.;KRAXBERGER, JR. ALLEN W.
分类号 H01L21/00;(IPC1-7):G01P3/02 主分类号 H01L21/00
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