发明名称 |
System and method for calibrating semiconductor processing equipment |
摘要 |
A system for measuring the rotational speed of a shaft driven by a motor. The system includes a rotation measurement device having a rotatable sensor and configured to generate a signal corresponding to rotation of the sensor. The rotation measurement device may be supported by a fixture mountable on the motor. A coupler is associated with the sensor and includes a gripping surface configured to contact and grip the end-surface of the shaft to couple the sensor to the shaft and impart the rotation of the shaft to the sensor.
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申请公布号 |
US6453742(B1) |
申请公布日期 |
2002.09.24 |
申请号 |
US20000585892 |
申请日期 |
2000.05.31 |
申请人 |
SEH AMERICA, INC. |
发明人 |
WHITE BARTON V.;KRAXBERGER, JR. ALLEN W. |
分类号 |
H01L21/00;(IPC1-7):G01P3/02 |
主分类号 |
H01L21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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