| 摘要 |
An arrangement for polishing a workpiece in a chemical mechanical polishing apparatus has a rotatable platen with an aperture that allows a laser interferometric measuring device to measure the surface condition of a workpiece being polished. A transparent block is flexibly attached to the top surface of the platen over the platen aperture to rotate with the platen. A polishing pad is disposed on the top surface of the platen, and has a hole extending through the pad configured to fit over the transparent block attached to the platen.
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