发明名称 METHOD FOR CALCULATING COMPENSATION FOR PRODUCT DEFECT
摘要 <p>PROBLEM TO BE SOLVED: To provide a method for calculating compensation for product defect by which a product defect can be easily compensated when the product defect due to a preformed article is generated in the production process of a processing industry. SOLUTION: In the method for calculating compensation for product defect, a material dealer delivers the preformed article of a product to the processing industry, and when the generation of a defect is recognized in the product as a result after the preformed article is processed into a product and inspected in the processing industry, the product defect caused by the defect of the preformed article in such a defective article is compensated. In an arithmetic part 7 of a computer 1, the quantity of preformed article to be compensated or the amount of compensation corresponding to the quantity of defective products which are caused by the preformed article exceeding the quantity of exemption is calculated by using prescribed data and a calculation expression.</p>
申请公布号 JP2002269177(A) 申请公布日期 2002.09.20
申请号 JP20010065927 申请日期 2001.03.09
申请人 SHIN ETSU CHEM CO LTD 发明人 TAYA MINORU;SHIMADA TADAKATSU;FUKUI KEITARO;HIRASAWA HIDEO
分类号 G01M11/02;C03B8/04;C03B20/00;G06Q50/00;G06Q50/04;(IPC1-7):G06F17/60 主分类号 G01M11/02
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