发明名称 TRANSMISSION PATH TESTING CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a transmission path testing circuit which prepares two reception data, having a phase difference in proportion to the number of bits of frame bits and switches the two reception data according to a switching signal by a reception side frame pulse and a transmission side frame pulse, so that a circuit scale can be reduced. SOLUTION: A transmission path test circuit has a loop circuit for carrying out a transmission path test in a multiplexing transmitter for multiplexing a plurality of transmission signals to transmit. The loop circuit prepares two reception data, having a phase difference in proportion to the number of bits of frame bits and switches the two reception data, according to a switching signal by a reception side frame pulse and a transmission side frame pulse, and a loop is constituted in a state with the frame bits being passed for transmission and reception as they are, even for any phase difference between transmission and reception.
申请公布号 JP2002271289(A) 申请公布日期 2002.09.20
申请号 JP20010069370 申请日期 2001.03.12
申请人 TOYO COMMUN EQUIP CO LTD 发明人 MURATA HIROSHI
分类号 H04L1/00;H04J3/14;H04M3/26;(IPC1-7):H04J3/14 主分类号 H04L1/00
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