发明名称 |
METHOD FOR FABRICATING INSULATED GATE FIELD EFFECT TRANSISTOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a novel method for fabricating an insulated gate field effect transistor in which the problem of gate resistance of an insulated gate field effect transistor is solved. SOLUTION: In the method for fabricating an insulated gate field effect transistor where a channel region, a source region 6, a body contact region 7, an offset region and a drain region 9 are formed on a semiconductor substrate, dosage at the time of ion implantation for forming the body contact region 7 is set less than the dosage at the time of ion implantation for forming the source region 6 and the drain region 9.
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申请公布号 |
JP2002270852(A) |
申请公布日期 |
2002.09.20 |
申请号 |
JP20010069883 |
申请日期 |
2001.03.13 |
申请人 |
NIPPON TELEGR & TELEPH CORP <NTT> |
发明人 |
MATSUMOTO SATOSHI;SAKAI TATSURO |
分类号 |
H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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