发明名称 |
METHOD AND APPARATUS FOR LASER ANNEALING, MASK, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To enhance productivity by increasing throughput while keeping necessary image-forming capability. SOLUTION: An object (a-Si film) 6 to be processed is irradiated with an excimer laser beam through a reticle 21 in which a plurality of repeatedly- patterned chevron-shaped openings 21-1-21-N are formed. To polycrystallize inside of each laser-irradiated region of the object (a-Si film) 6 to be processed, the excimer laser beam is divided to shrink to form a plurality of laser beams, which are respectively directed to the patterned openings 21-1-21-N of the reticle 21. The laser beams, which respectively pass through the patterned openings 21-1-21-N, form images on the object (a-Si film) 6 to be processed.
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申请公布号 |
JP2002270536(A) |
申请公布日期 |
2002.09.20 |
申请号 |
JP20010065254 |
申请日期 |
2001.03.08 |
申请人 |
TOSHIBA CORP |
发明人 |
FUJIWARA JUNJI;ITO HIROSHI |
分类号 |
H01L21/20;H01L21/268;H01L21/336;H01L29/786;(IPC1-7):H01L21/268 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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