发明名称 METHOD AND APPARATUS FOR LASER ANNEALING, MASK, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To enhance productivity by increasing throughput while keeping necessary image-forming capability. SOLUTION: An object (a-Si film) 6 to be processed is irradiated with an excimer laser beam through a reticle 21 in which a plurality of repeatedly- patterned chevron-shaped openings 21-1-21-N are formed. To polycrystallize inside of each laser-irradiated region of the object (a-Si film) 6 to be processed, the excimer laser beam is divided to shrink to form a plurality of laser beams, which are respectively directed to the patterned openings 21-1-21-N of the reticle 21. The laser beams, which respectively pass through the patterned openings 21-1-21-N, form images on the object (a-Si film) 6 to be processed.
申请公布号 JP2002270536(A) 申请公布日期 2002.09.20
申请号 JP20010065254 申请日期 2001.03.08
申请人 TOSHIBA CORP 发明人 FUJIWARA JUNJI;ITO HIROSHI
分类号 H01L21/20;H01L21/268;H01L21/336;H01L29/786;(IPC1-7):H01L21/268 主分类号 H01L21/20
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