发明名称 GaN-BASED FIELD EFFECT TRANSISTOR
摘要 PROBLEM TO BE SOLVED: To provide a GaN-based FET with low on resistance, a easily realized pinch off state, and large current switching operation is enabled at a high temperature. SOLUTION: In the GaN-based FET, a lower part gate electrode 2A composed of the same material as a gate electrode 2B to be formed, is formed directly on a semiinsulating substrate 1, with the same pattern as the gate electrode 2B, at least one active layer composed of GaN-based compound semiconductor being formed by embedding the electrode 2A, a gate electrode 2B is formed on the active layer 3, and the gate electrode 2A, 2B are arranged in the vertical direction, sandwiching the active layer 3.
申请公布号 JP2002270618(A) 申请公布日期 2002.09.20
申请号 JP20010062323 申请日期 2001.03.06
申请人 FURUKAWA ELECTRIC CO LTD:THE 发明人 YOSHIDA KIYOTERU;WADA TAKAHIRO
分类号 H01L29/812;H01L21/338;H01L29/778;(IPC1-7):H01L21/338 主分类号 H01L29/812
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