发明名称 SEMICONDUCTOR DEVICE AND CONSTANT-VOLTAGE CIRCUIT
摘要 PROBLEM TO BE SOLVED: To prevent damage to the gate oxide film of a lateral DMOS transistor. SOLUTION: The P-channel lateral DMOS transistor 5 as an output transistor is installed across an input terminal 1 and an output terminal 3. A protective diode 11 is connected across the gate electrode interconnection of the transistor 5 and the source of the transistor 5. The protective diode has a reverse breakdown strength which is about half the gate-oxide-film breakdown voltage of the transistor 5. When the voltage of the gate electrode interconnection of the transistor 5 becomes about half the gate-oxide-film breakdown voltage of the transistor 5, the protective diode 11 is broken down, droppage in the voltage of the gate-electrode interconnection is prevented, and damages to the gate oxide film of the transistor 5 is prevented.
申请公布号 JP2002270781(A) 申请公布日期 2002.09.20
申请号 JP20010069399 申请日期 2001.03.12
申请人 RICOH CO LTD 发明人 NEGORO TAKAAKI;KIMURA TAKESHI
分类号 H01L21/76;G05F1/56;H01L21/822;H01L21/8234;H01L21/8238;H01L27/04;H01L27/06;H01L27/088;H01L27/092;H01L29/78;(IPC1-7):H01L27/06;H01L21/823 主分类号 H01L21/76
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