发明名称 |
SEMICONDUCTOR DEVICE AND CONSTANT-VOLTAGE CIRCUIT |
摘要 |
PROBLEM TO BE SOLVED: To prevent damage to the gate oxide film of a lateral DMOS transistor. SOLUTION: The P-channel lateral DMOS transistor 5 as an output transistor is installed across an input terminal 1 and an output terminal 3. A protective diode 11 is connected across the gate electrode interconnection of the transistor 5 and the source of the transistor 5. The protective diode has a reverse breakdown strength which is about half the gate-oxide-film breakdown voltage of the transistor 5. When the voltage of the gate electrode interconnection of the transistor 5 becomes about half the gate-oxide-film breakdown voltage of the transistor 5, the protective diode 11 is broken down, droppage in the voltage of the gate-electrode interconnection is prevented, and damages to the gate oxide film of the transistor 5 is prevented.
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申请公布号 |
JP2002270781(A) |
申请公布日期 |
2002.09.20 |
申请号 |
JP20010069399 |
申请日期 |
2001.03.12 |
申请人 |
RICOH CO LTD |
发明人 |
NEGORO TAKAAKI;KIMURA TAKESHI |
分类号 |
H01L21/76;G05F1/56;H01L21/822;H01L21/8234;H01L21/8238;H01L27/04;H01L27/06;H01L27/088;H01L27/092;H01L29/78;(IPC1-7):H01L27/06;H01L21/823 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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