发明名称 SLURRY FOR POLISHING
摘要 <p>PROBLEM TO BE SOLVED: To provide new slurry for polishing that has one's own oxidation force in a polishing abrasive, and has polishing characteristics also to Cu. SOLUTION: The slurry for polishing should contain a spinel type manganese oxide that includes a different kind of metal M in an 8A site and is shown by a general expression M1- XMn2 O4 (0<X<=1). The slurry for polishing should extract the different kind of metal M of the 8A site by acid treatment, and be mentioned in claims 1 to 3. The slurry for polishing should have a pH of 3.0 or less and 0.1 or more, and be mentioned in claims 1 to 4. Additionally, the slurry for polishing should be used for polishing the wiring material of a semiconductor integrated circuit for flattening, and be mentioned in the claims 1 to 5.</p>
申请公布号 JP2002270548(A) 申请公布日期 2002.09.20
申请号 JP20010065349 申请日期 2001.03.08
申请人 TOSOH CORP 发明人 YOSHIDA SETSUO
分类号 B24B37/00;C09K3/14;H01L21/304;(IPC1-7):H01L21/304 主分类号 B24B37/00
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