发明名称 SLURRY FOR POLISHING
摘要 <p>PROBLEM TO BE SOLVED: To provide slurry for polishing where polishing characteristics corresponding to the degree of Mn oxidation manifest themselves by controlling the degree of Mn oxidation in polishing agent. SOLUTION: The Mn 508 having an average particle diameter (D 50) of 1μm is set to 1 wt.% slurry by ultra pure water, potassium hydroxide where a guaranteed reagent is diluted, and sulphuric acid are dropped for adjusting to arbitrary slurry where the pH of the slurry is 12.0 to 0.5. Then, the 15 mm- square dicing product of a wafer that is plated with Cu is used as a sample, is fitted onto a work plate 1, and is inserted into a correction ring 2. The adjusted slurry is supplied from a slurry supply nozzle 4 at a dropping speed of 20 ml/min, and at the same time is polished by setting the rotational speed of a surface plate 3 to 30 rpm.</p>
申请公布号 JP2002270547(A) 申请公布日期 2002.09.20
申请号 JP20010065348 申请日期 2001.03.08
申请人 TOSOH CORP 发明人 YOSHIDA SETSUO
分类号 B24B37/00;C09K3/14;H01L21/304;H01L21/306;(IPC1-7):H01L21/304 主分类号 B24B37/00
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