发明名称 Device and method to reduce wordline RC time constant in semiconductor memory devices
摘要 A semiconductor memory device and a method of making and using a semiconductor memory device containing a word line design, which is used in ultra-large scale integrated (ULSI) circuits, that produces a device with a lower RC time constant than devices formed using prior art techniques. In one embodiment of the invention low resistivity metal strapping layers are attached to alternating halves of wordlines in a single memory array. The alternating pattern allows the low resistivity of the strapping layers to be utilized without introducing significant negative capacitive resistance effects due to strapping layers being too close to each other.
申请公布号 US2002131290(A1) 申请公布日期 2002.09.19
申请号 US20010808750 申请日期 2001.03.15
申请人 VO HUY THANH 发明人 VO HUY THANH
分类号 G11C5/06;G11C8/14;(IPC1-7):G11C5/06 主分类号 G11C5/06
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