发明名称 Imaging, measuring at least part of surface of at least one three-dimensional object involves computing 3D information continuously using multiple acquisition units and self-calibration data
摘要 The method involves projecting a light pattern onto object or surface areas, using image acquisition units with the light pattern in their overlapping fields of view to simultaneously produce 2D image information from different positions and deriving 3D information. A computer unit computes 3D information continuously using self-calibration information. The relative positions of light source and object are varied to illuminate different areas. The method involves projecting a light pattern onto areas of the object or surface, using at least two image acquisition units with the light pattern in their overlapping fields of view, to produce two-dimensional image information from different positions and deriving three-dimensional information from the two-dimensional information. The illuminated areas are simultaneously observed by the units, the acquired information is fed to a computer unit, which computes three-dimensional information continuously using self-calibration information, and the relative positions of the light source and object are varied to illuminate different areas. AN Independent claim is also included for the following: an arrangement for conducting a measurement process for at least partial acquisition and measurement of a surface of at least one three-dimensional object or of optional surfaces.
申请公布号 DE10149750(A1) 申请公布日期 2002.09.19
申请号 DE20011049750 申请日期 2001.10.09
申请人 TECMATH AG 发明人 HANFELD, HELMUT;HARVEN, QUIDO
分类号 G01B11/25;G01C11/06;G01C11/30;(IPC1-7):G01C11/30;G01B11/24;G01C11/26;G06K7/10 主分类号 G01B11/25
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