| 摘要 |
The invention relates to an integrated circuit testing device. It comprises: means (3) for generating and applying, at the input of an integrated circuit under test (1) and at the input of a reference integrated circuit (2), input signals and means (4) for comparing, in real time, output signals delivered at the output of the integrated circuit under test (1) and at the output of the reference integrated circuit (2), in response to the input signals, in order to determine whether the integrated circuit under test is in order or is faulty. The integrated circuits (1 and 2) are mounted in parallel and receive simultaneously the input signals simulating the input signals that the integrated circuits would receive in the functional situation. This testing device is used, in particular, to test integrated circuits for decoding digital television signals.
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