发明名称 Universal test interface between a device under test and a test head
摘要 In order to form a modular interface between a DUT board, which is housing devices under tests (DUT), to cables connected to a test head, a board spacer is provided that has an array of connectors. Each cable is connected to a respective connector, and the DUT board contains a corresponding array of connection points which are less than or equal to the number of connectors in the arrays on the board spacer. In this way, a common board spacer can be used to connect the cables to DUT boards housing different types of DUTs since the location of the connection points on the board spacer is known and kept constant. This interface allows a high speed and high fidelity connection between the test head and the devices on the DUTs for frequencies in excess of 50 MHz.
申请公布号 US2002130653(A1) 申请公布日期 2002.09.19
申请号 US20010808009 申请日期 2001.03.15
申请人 FRAME JAMES WARREN 发明人 FRAME JAMES WARREN
分类号 G01R1/073;G01R31/28;(IPC1-7):G01R1/00 主分类号 G01R1/073
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