发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND PROCESS FOR PRODUCING THE SAME
摘要 A WNX film (24) constituting the barrier layer of a gate electrode (7A) having a polymetal structure is formed in an atmosphere containing nitrogen gas in a high concentration. Thus, the WNX film (24) is inhibited from releasing nitrogen during a heating step after the formation of the gate electrode (7A).
申请公布号 WO02073697(A1) 申请公布日期 2002.09.19
申请号 WO2001JP09548 申请日期 2001.10.31
申请人 HITACHI, LTD.;YAMAMOTO, NAOKI;TANABE, YOSHIKAZU;KOGAYU, HIROSHIGE;YOSHIDA, TAKEHIKO 发明人 YAMAMOTO, NAOKI;TANABE, YOSHIKAZU;KOGAYU, HIROSHIGE;YOSHIDA, TAKEHIKO
分类号 H01L21/28;H01L21/285;H01L21/324;H01L21/8242;H01L27/108;H01L29/49 主分类号 H01L21/28
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