发明名称 SUBSTRATE FOR MEASUREMENT OF MEASURED DEVICE
摘要 PROBLEM TO BE SOLVED: To shorten a wiring length of a contact part with respect to a measured device, and to reduce the number of contact points. SOLUTION: An elastic layer 143 having a plane coplanar to an upper face of an insulation substrate 141 is formed by filling an elastic material such as synthetic rubber in a recessed part 142 formed in a measured device mounting portion 141A of the insulation substrate 141 constituting a measuring substrate 14. Plural plane contact conductors 144 of slender width contacting individually with respective pins 122 in both sides of the measured device 12 are provided on the insulation substrate 141 to be extended from a portion overhung over the elastic layer 143 in the measured device mounting portion 141A toward a projection direction of the pins 122, a portion 144A of the contact part 144 in a portion contacting with the pin 122 is arranged to be faced to an upper face of the elastic layer 143, and the portion 144A is supported by the elastic layer 143.
申请公布号 JP2002267716(A) 申请公布日期 2002.09.18
申请号 JP20010070994 申请日期 2001.03.13
申请人 SONY CORP 发明人 WAKIZAKA HIROSHI;UEZONO ITARU
分类号 G01R31/26;G01R1/06;(IPC1-7):G01R31/26 主分类号 G01R31/26
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