发明名称 |
POLISHING METHOD FOR SEMICONDUCTOR WAFER AND POLISHING DEVICE THEREFOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a polishing method for a semiconductor wafer capable of improving shape accuracy of a polishing face. SOLUTION: When pressing the semiconductor wafer W onto a polishing cloth on a polishing surface plate through an elastic body by air to execute one-side polishing, the semiconductor wafer W is pressed by air supplied to a circular recessed part 4 open downward having a diameter larger than the wafer W through an elastic sheet 6 stretched in an opening end part of the recessed part 4 to airtightly close the recessed part 4, a support position P of the elastic sheet 6 in the opening end part of the recessed part 4 is adjusted vertically to the upper face of the semiconductor wafer W, and the one-side polishing is executed. |
申请公布号 |
JP2002264005(A) |
申请公布日期 |
2002.09.18 |
申请号 |
JP20010067162 |
申请日期 |
2001.03.09 |
申请人 |
TOSHIBA CERAMICS CO LTD;TOSHIBA CORP |
发明人 |
KOJIMA KATSUYOSHI;ISOGAI HIROMICHI;IKEDA MASATOSHI;MASUNAGA TAKAYUKI |
分类号 |
B24B37/005;B24B37/04;B24B37/30;H01L21/304 |
主分类号 |
B24B37/005 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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