发明名称 POLISHING METHOD FOR SEMICONDUCTOR WAFER AND POLISHING DEVICE THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a polishing method for a semiconductor wafer capable of improving shape accuracy of a polishing face. SOLUTION: When pressing the semiconductor wafer W onto a polishing cloth on a polishing surface plate through an elastic body by air to execute one-side polishing, the semiconductor wafer W is pressed by air supplied to a circular recessed part 4 open downward having a diameter larger than the wafer W through an elastic sheet 6 stretched in an opening end part of the recessed part 4 to airtightly close the recessed part 4, a support position P of the elastic sheet 6 in the opening end part of the recessed part 4 is adjusted vertically to the upper face of the semiconductor wafer W, and the one-side polishing is executed.
申请公布号 JP2002264005(A) 申请公布日期 2002.09.18
申请号 JP20010067162 申请日期 2001.03.09
申请人 TOSHIBA CERAMICS CO LTD;TOSHIBA CORP 发明人 KOJIMA KATSUYOSHI;ISOGAI HIROMICHI;IKEDA MASATOSHI;MASUNAGA TAKAYUKI
分类号 B24B37/005;B24B37/04;B24B37/30;H01L21/304 主分类号 B24B37/005
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