发明名称 REFLECTING CHARACTERISTIC MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To easily identify flaws or the like on the surface of a sample. SOLUTION: An imaging light source 21 of an imaging illumination part 20 is arranged in the outside vicinity of an illumination opening 17 of an integrating sphere 10, composed of a light source having directivity, and illuminates the sample 8 arranged in a sample opening 14 from the direction inclined by a specified angle relative to a normal 14n on the opening surface of the sample opening 14, through the illumination angle 17. An imaging optical system 31 of an imaging part 30 forms an image of a sample 8 arranged in the sample opening 14 on the light receiving surface of an area sensor 32 through an imaging opening 16, and forms the image of a range containing a part of the sample opening 14. The area sensor 32 is formed by two-dimensionally arranging a photoelectric conversion element such as a plurality of CCDs for example, operated based on a control signal from a control part 50, and outputs an electric signal corresponding to the intensity of light received as an imaging signal.
申请公布号 JP2002267600(A) 申请公布日期 2002.09.18
申请号 JP20010068140 申请日期 2001.03.12
申请人 MINOLTA CO LTD 发明人 IMURA KENJI
分类号 G01J3/42;G01J1/12;G01J3/50;G01N21/27;(IPC1-7):G01N21/27 主分类号 G01J3/42
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