发明名称 DIFFERENTIAL INTERFERENCE MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a differential interference microscope which can be easily attached to a normal microscope and of which direction of a shear can be easily changed with a simple mechanism. SOLUTION: The differential interference microscope is provided with a light source, an illumination optical system, and an observation optical system arranged at the side opposite to the illumination optical system across a sample S. The illumination optical system has a first polarizing element 11, a first birefringence element 12, and a condenser lens 2. The observation optical system has an object lens 3, a second birefringence element 13, and a second polarizing element 14. The first polarizing element 11 and the first birefringence element 12 are held by a rotating member, respectively, and are rotatable by making the optical axis of the illumination optical system as a rotation axis. The second polarizing element 14 and the second birefringence element 13 are held by the rotating member, respectively, and are rotatable by having the optical axis of the illumination optical system as a rotation axis.
申请公布号 JP2002267932(A) 申请公布日期 2002.09.18
申请号 JP20010068439 申请日期 2001.03.12
申请人 OLYMPUS OPTICAL CO LTD 发明人 KONO YOSHIHIRO;KUSAKA KENICHI
分类号 G02B21/00;(IPC1-7):G02B21/00 主分类号 G02B21/00
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