发明名称 Methods for forming lateral trench optical detectors
摘要 A method for forming an optical detector device on a semiconductor substrate. The method includes forming a first set and a second set of trenches in the substrate, wherein trenches of the first set are alternately disposed with respect to trenches of the second set, filling the trenches with a sacrificial material, and etching the sacrificial material from the first set of trenches. The method further includes filling the first set of trenches with a doped material of a first conductivity, etching the sacrificial material from a second set of trenches, filling the second set of trenches with a doped material of a second conductivity, forming a first junction layer by driving dopants from the doped material in each of the first set of trenches and forming a second junction layer by driving dopants from the doped material in each of the second set of trenches, and providing separate wiring connections to the first set of trenches and the second set of trenches. The first and second set of trenches are formed simultaneously.
申请公布号 US6451702(B1) 申请公布日期 2002.09.17
申请号 US20010784963 申请日期 2001.02.16
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 YANG MIN;RIM KERN
分类号 H01L31/10;H01L27/144;H01L31/0352;H01L31/103;H01L31/105;(IPC1-7):H01L21/302 主分类号 H01L31/10
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