Optimized burn-in for fixed time dynamic logic circuitry

摘要

A system and method for ensuring comprehensive testing coverage of components within a dynamic logic macro during a burn-in test cycle. Burn-in testing is initiated within dynamic logic circuit having a dynamic logic block and a self-reset loop for generating a reset signal. A multiple phase burn-in test input is applied to the self-reset loop for modifying the duration of the reset signal during burn-in testing, such that the components within the dynamic logic macro are adequately stressed during the burn-in test cycle.