发明名称 Double chamber ion implantation system
摘要 An improved double chamber ion source comprising a plasma generating chamber, a charge exchange chamber and a divider structure therebetween. The charge exchange chamber includes magnetic shielding material to reduce exposure of interior components to magnetic field lines externally generated. The double compartment ion source further comprises inclusion of a heat shield and/or a cooling system to overcome deleterious effects caused by increased temperature in the plasma generating chamber. The divider structure has a plurality of apertures having a configuration to reduce surface area on the divider structure in the charge exchange chamber.
申请公布号 US2002125829(A1) 申请公布日期 2002.09.12
申请号 US20010800539 申请日期 2001.03.07
申请人 ADVANCED TECHNOLOGY MATERIALS INC. 发明人 VELLA MICHAEL C.
分类号 H01J27/14;H01J37/08;(IPC1-7):H01J7/24 主分类号 H01J27/14
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