发明名称 Method of making non-volatile memory with sharp corner
摘要 A floating gate with sharp corner is disclosed. Wherein the sharp level of the sharp corners is control by the deposition thickness of the conductive spacers. The method comprises forming a first dielectric layer on the semiconductor substrate as a gate dielectric. A first conductive layer is formed on the first dielectric layer, and a second dielectric layer is then formed thereon. The second dielectric layer and the first conductive layer are next patterned. Subsequently, conductive spacers with sharp corners are created by well know anisotropical etching. A tunneling dielectric layer is then formed on the surface of a floating gate consisting of the spacers and patterned structure. A second conductive layer is formed on the tunneling dielectric layer as a control gate.
申请公布号 US2002127804(A1) 申请公布日期 2002.09.12
申请号 US20010802786 申请日期 2001.03.08
申请人 TSENG HORNG-HUEI 发明人 TSENG HORNG-HUEI
分类号 H01L21/28;H01L21/8247;H01L27/115;H01L29/423;(IPC1-7):H01L21/336 主分类号 H01L21/28
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