发明名称 High precision laser bar test fixture
摘要 A test fixture for testing circuit components includes at least one test bar, at least one tray, a test pedestal, a transportable test stage, a pickup collet, a first camera, and a second camera. Each test bar contains at least one circuit component. Each tray contains at least one test bar. The test pedestal is adapted to hold at least one test bar. The transportable test stage includes at least one tray and the test pedestal. The transportable test stage transports the circuit component under test from the pickup collet to the test site and return. The trays and test pedestal are in a fixed position with respect to the test stage. The pickup collet picks up test bars from the trays and the test pedestal. The pickup collet also places the test bars in the trays and on the test pedestal. The first camera is used to visually align the pickup collet and components on the test stage, and read test bar identification codes. The second camera is used to visually align the test bars with a test site.
申请公布号 US2002126285(A1) 申请公布日期 2002.09.12
申请号 US20000739199 申请日期 2000.12.18
申请人 GILMORE STEVEN S.;LEIBY JOHN;RIZZO JOHN S.;WEIDNER KENNETH R. 发明人 GILMORE STEVEN S.;LEIBY JOHN;RIZZO JOHN S.;WEIDNER KENNETH R.
分类号 G01R31/01;G01R31/26;H01S5/00;H01S5/40;(IPC1-7):G01B11/00 主分类号 G01R31/01
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