| 摘要 |
PROBLEM TO BE SOLVED: To dispense with preparation of a function test pattern for a logical macro and provide the test pattern with high detection ratio in the test for an LSI including the logical macro. SOLUTION: When the test pattern is prepared, scan chains are prepared without distinguishing between the interior and the exterior of the logical macro by describing the logical macro by individual elements and replacing the logical macro with an equivalent circuit, in which FFs(Flip-Flops) are connected as scan chains, and connecting the logical macro with the FFs of general logic. The test pattern for the LSI including the logical macro is automatically generated by modifying information of connections of the FFs of the scan chains according to the logic replaced.
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