CONTACT PROBE AND PROBE DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a contact probe and a probe device using the same wherein it has a flexibility, crack is not created on a wiring pattern even when it is bent, and it is not necessary to bend a drawing conductor section of the wiring pattern corresponding to a position of an electrode of a printed circuit. SOLUTION: There is disclosed the contact probe 20 wherein the plurality of wiring patterns 2 are formed on a surface of a film 4 and each of the tips of the wiring patterns 2 is made to be a contact pin 2a. A part of the film 4 having the wiring patterns 2 formed thereon is removed in a direction across the wiring patterns 2 and a bending section 21 is filled with a silicon rubber S which is of a flexible and insulation member. The probe device is so constituted that the contact probe 20 is held in a condition that the contact probe 20 is bent at the bending section 21 by a mechanical component.