| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem wherein when changing of circuit/mounting information is made after a test designing process, a test designer may be burdened therewith and the testing work may be delayed. SOLUTION: This test aiding device comprises a testing database 24 that stores test program information and test jig designing information relating to a test program indicative of the circuit/mounting information and testing contents corresponding to a position to be tested on a printed board, a test information outputting means 12 for outputting the test program and the test jig designing information, a testing means classification database 13 that stores testing means classifications corresponding to the respective testing contents, and a circuit/mounting content changing means 14 for changing the content of the circuit/mounting information. The test aiding device further comprises a control means 17 that creates the testing content corresponding to the position to be tested based on the changed circuit/mounting information, reads the testing means classification corresponding to the testing content from the testing means classification database 13 and stores the test program and the test jig designing information corresponding to the position to be tested to the testing database 24 to update it.
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