发明名称 LITHOGRAPHIC APPARATUS AND METHOD OF MANUFACTURING A DEVICE
摘要 PURPOSE: An improved dose sensing and control system which avoids or alleviates the problems of known energy sensors and dose control systems is provided. CONSTITUTION: The lithographic projection apparatus comprises a radiation system for providing a projection beam of radiation; patterning means, for patterning the projection beam according to a desired pattern; a substrate table for holding a substrate; a projection system for imaging the patterned beam onto a target portion of the substrate, wherein the lithographic projection apparatus further comprises a sensor arranged to detect luminescence radiation produced in the projection system by the passage of the projection beam. The device manufacturing method comprises the steps of providing a substrate that is at least partially covered by a layer of radiation-sensitive material; providing a projection beam of radiation using a radiation system; using patterning means to endow the projection beam with a pattern in its cross-section; and projecting the patterned beam of radiation onto a target area of the layer of radiation-sensitive material of the substrate, wherein the device manufacturing method further comprises the step of detecting luminescence radiation produced in the projection system by the passage of the projection beam.
申请公布号 KR20020070789(A) 申请公布日期 2002.09.11
申请号 KR20020007288 申请日期 2002.02.08
申请人 ASML NETHERLANDS B.V. 发明人 MULKENS JOHANNES CATHARINUS HUBERTUS;VANDERVEEN PAUL
分类号 G01M11/02;G03F7/20;H01L21/027;(IPC1-7):G03F7/20 主分类号 G01M11/02
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