| 摘要 |
PROBLEM TO BE SOLVED: To obtain a high frequency characteristic measurement substrate capable of easily measuring the high-frequency characteristics of an electronic component with different electric potentials between adjacent external terminals by only putting the electronic component. SOLUTION: On the main side of a dielectric substrate 2, an electrode 3 for a signal line, and a first ground electrodes 5 and 6 isolated from the electrode 3 for the signal line by way of gaps 4a and 4b are formed. On the whole surface of the other side, a second ground electrode 7 is formed and at least one of first projections 3c to 3f, extending from the electrode 3 for the signal line to the first ground electrodes 5 and 6 and second projections 5b, 5c, 6b and 6c extending from the ground electrodes 5 and 6 to the electrode 3 for the signal line, is formed in a high-frequency characteristic measurement substrate 1. |
