发明名称 EQUIPMENT AND METHOD FOR LIQUID TREATMENT
摘要 PROBLEM TO BE SOLVED: To provide an equipment and a method of liquid treatment, which can improve uniformity of liquid treatment to be performed on a substrate to be treated. SOLUTION: This method comprises contacting the wafer W with a plating liquid by lowering a holding part 31 for holding a wafer W; heating the wafer W in the state with a resistor exothermic body 46 arranged in the holding part 31, so that the temperature of the wafer W can become gradually higher in the center than the contour parts; and then applying voltage between an anode electrode 22 and the wafer W, to plate the surface to be plated of the wafer W.
申请公布号 JP2002256486(A) 申请公布日期 2002.09.11
申请号 JP20010062262 申请日期 2001.03.06
申请人 TOKYO ELECTRON LTD 发明人 MARUMO YOSHINORI
分类号 C25D7/12;C25D17/06;C25D21/02;H01L21/00;H01L21/288;(IPC1-7):C25D7/12 主分类号 C25D7/12
代理机构 代理人
主权项
地址