| 摘要 |
PROBLEM TO BE SOLVED: To easily scan a linear polarized beam at a high speed, high reliability, and high repeated positioning precision, without using a mechanical moving part, in an optical magnetic domain detector using a Kerr effect or a Faraday effect for scanning a sample surface two-dimensionally by the linear polarized beam to detect a magnetic domain. SOLUTION: In this light beam scanning type linear magnetic domain detector, a light source part is constituted of an array of light emitting diode(LED) elements 2 or semiconductor laser elements, or a light source of high luminous energy and a liquid crystal panel, and the linear polarization is scanned electronically in the magnetic domain detector for a magnetic material provided with the light source part irradiating a measuring object while scanning the object with the linear polarized light, a means for impressing a magnetic field to the measuring object, a polarization detector for detecting reflected light from the measuring object, and an imaged signal processor for visualizing magnetic domain structure based on a polarization intensity output signal of the polarization detector.
|
