发明名称 Adaptive reference cells for a memory device
摘要 A memory device is provided with reference cells that can be adapted to the core cells of the memory device. An erase verify reference cell. is adapted to the core cells by changing the threshold voltage of the erase verify reference cell until substantially all the core cells pass an erase verification test. A program verify reference cell is then setup by changing the threshold voltage of the program reference cell by a desired change in voltage between erased and programmed states. A read reference cell is also setup by changing the threshold voltage of the read reference cell so that it is intermediate of the erase verify reference cell and the program verify reference cell.
申请公布号 US6449190(B1) 申请公布日期 2002.09.10
申请号 US20010764965 申请日期 2001.01.17
申请人 ADVANCED MICRO DEVICES, INC. 发明人 BILL COLIN S.
分类号 G11C16/28;(IPC1-7):G11C16/00 主分类号 G11C16/28
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