| 摘要 |
A method and an apparatus are described for detecting particles on surfaces. Particles are transferred from the surface to be inspected onto a tacky sheet by applying the tacky sheet to the surface and then removing the tacky sheet from the surface. Particles and defects are optically detected on the removed tacky sheet to produce location data. The tacky sheet is selected to leave no residue on the surface to be inspected. The tacky sheet is selected to be compatible with darkfield optical techniques. In one embodiment the tacky sheet is inspected prior applying the tacky sheet to the surface to be inspected, so that particles from the surface are identified as differences between the location data before and after applying the tacky sheet to the surface to be inspected. In one embodiment the tacky sheet is re-applied and reinspected many times before it is replaced.
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