发明名称 Polishing apparatus
摘要 A polishing apparatus applicable to a dry-in/dry-out polishing system is capable of increasing the capacity of processing substrates to be polished, e.g. semiconductor wafers, per unit of time and per unit area of installation. A polishing unit includes a turntable having a polishing surface, and at least two wafer carriers each adapted to hold a wafer and to press the wafer against the polishing surface. Each wafer carrier is supported by a pivot shaft and movable between a polishing position where the wafer is polished on the turntable and a transfer position for transferring the wafer. The at least two wafer carriers can be situated at the polishing position simultaneously and also alternately.
申请公布号 US6447385(B1) 申请公布日期 2002.09.10
申请号 US20000605989 申请日期 2000.06.29
申请人 EBARA CORPORATION 发明人 TOGAWA TETSUJI;TAKADA NOBUYUKI
分类号 B24B37/04;H01L21/304;(IPC1-7):B24B5/00 主分类号 B24B37/04
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