发明名称 Ultra thin etch stop layer for damascene process
摘要 A metal interconnect structure and method of making the same provides an ultra thin etch stop layer employed in conjunction with low k dielectric layers. The thinness of the etch stop layer allows higher k dielectric materials to be used as the etch stop material without increasing the overall k value of the dielectric layer/etch stop layer combination.
申请公布号 US6448654(B1) 申请公布日期 2002.09.10
申请号 US20010770468 申请日期 2001.01.29
申请人 ADVANCED MICRO DEVICES, INC. 发明人 GABRIEL CALVIN T.;OKADA LYNNE A.
分类号 H01L23/522;H01L23/532;(IPC1-7):H01L23/48 主分类号 H01L23/522
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