发明名称 X-RAY MEASURING INSTRUMENT AND X-RAY MEASURING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To measure the partial region of a sample without using a collimator or without accurately arranging a collimator at a specific position close to the sample even if the collimator is used. SOLUTION: The X-ray measuring instrument has an X-ray source for generating X-rays R0 applied to the sample S and an X-ray detector for detecting the X-rays R1 diffracted by the sample S and also has a mask 9 for covering the X-ray irradiation surface of the sample S. The mask 9 is formed from a single crystal substance and has an aperture 15 permitting X-ray R0 to pass. The partial region S0 of the sample S controlled by the aperture 15 can be set to a measuring object.</p>
申请公布号 JP2002250704(A) 申请公布日期 2002.09.06
申请号 JP20010049834 申请日期 2001.02.26
申请人 RIGAKU CORP 发明人 DOSHIYOU AKIHIDE
分类号 G01N23/20;G01T1/00;G01T1/29;G21K1/02;G21K1/06;(IPC1-7):G01N23/20 主分类号 G01N23/20
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