发明名称 |
X-RAY MEASURING INSTRUMENT AND X-RAY MEASURING METHOD |
摘要 |
<p>PROBLEM TO BE SOLVED: To measure the partial region of a sample without using a collimator or without accurately arranging a collimator at a specific position close to the sample even if the collimator is used. SOLUTION: The X-ray measuring instrument has an X-ray source for generating X-rays R0 applied to the sample S and an X-ray detector for detecting the X-rays R1 diffracted by the sample S and also has a mask 9 for covering the X-ray irradiation surface of the sample S. The mask 9 is formed from a single crystal substance and has an aperture 15 permitting X-ray R0 to pass. The partial region S0 of the sample S controlled by the aperture 15 can be set to a measuring object.</p> |
申请公布号 |
JP2002250704(A) |
申请公布日期 |
2002.09.06 |
申请号 |
JP20010049834 |
申请日期 |
2001.02.26 |
申请人 |
RIGAKU CORP |
发明人 |
DOSHIYOU AKIHIDE |
分类号 |
G01N23/20;G01T1/00;G01T1/29;G21K1/02;G21K1/06;(IPC1-7):G01N23/20 |
主分类号 |
G01N23/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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