发明名称 CONNECTING SEMICONDUCTOR EVALUATION SYSTEM AND CONNECTING SEMICONDUCTOR EVALUATION METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a connecting semiconductor evaluation system and a connecting semiconductor evaluation method which perform connection evaluation of a semiconductor automatically, accurately and quickly. SOLUTION: This connecting semiconductor evaluation system and the method are constituted with a semiconductor database search means 5 to search information about the above- mentioned semiconductor under purchase evaluation and the connecting semiconductor from a router 2 to input the information about the semiconductor under the purchase evaluation, which a customer 20 considers to purchase, to an information means 4 through a network, a database 6 of the semiconductor under the purchase evaluation and a database 7 of the connecting semiconductor to be connected to the semiconductor under the purchase evaluation, a connection setting evaluation means 8 to evaluate the connection setting between the above- mentioned semiconductor under the purchase evaluation and the connecting semiconductor based on an automatic calculation using the information about both of these semiconductors above-mentioned, a display means 9 to display results of the above-mentioned search means 5 and the connection setting evaluation means 8, a control means 12 to control the above- mentioned search means 5, the above-mentioned information input means 4, the above- mentioned connection setting evaluation means 8 and the above-mentioned display means 9, and an evaluation information recording means 10 to record the information about the connecting semiconductor evaluated in the above-mentioned connection setting evaluation means 8.</p>
申请公布号 JP2002251430(A) 申请公布日期 2002.09.06
申请号 JP20010047791 申请日期 2001.02.23
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 IGUCHI MASAYASU
分类号 G06Q10/00;G06F17/30;G06Q50/00;G06Q50/04;(IPC1-7):G06F17/60 主分类号 G06Q10/00
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