发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a multiple value mask ROM which is difficult to receive the influence of short channel effect without using a special refinement technol ogy. SOLUTION: A source Shottky electrode 14 is formed on the region 4 of MOS FET which is the memory cell of a mask ROM and a drain Shottky electrode 15 is formed on the drain region 5. The multiple value condition is stored because the distances between the source region 4 and the gate electrode 3 is different.
申请公布号 JP2002252288(A) 申请公布日期 2002.09.06
申请号 JP20010048433 申请日期 2001.02.23
申请人 TOSHIBA CORP 发明人 MATSUZAWA KAZUYA;NOGUCHI MITSUHIRO;NISHIYAMA AKIRA;UCHIDA KEN;NUMATA TOSHINORI
分类号 H01L27/112;H01L21/8246 主分类号 H01L27/112
代理机构 代理人
主权项
地址