发明名称 |
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a multiple value mask ROM which is difficult to receive the influence of short channel effect without using a special refinement technol ogy. SOLUTION: A source Shottky electrode 14 is formed on the region 4 of MOS FET which is the memory cell of a mask ROM and a drain Shottky electrode 15 is formed on the drain region 5. The multiple value condition is stored because the distances between the source region 4 and the gate electrode 3 is different. |
申请公布号 |
JP2002252288(A) |
申请公布日期 |
2002.09.06 |
申请号 |
JP20010048433 |
申请日期 |
2001.02.23 |
申请人 |
TOSHIBA CORP |
发明人 |
MATSUZAWA KAZUYA;NOGUCHI MITSUHIRO;NISHIYAMA AKIRA;UCHIDA KEN;NUMATA TOSHINORI |
分类号 |
H01L27/112;H01L21/8246 |
主分类号 |
H01L27/112 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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