发明名称 Double-bit non-volatile memory structure and corresponding method of manufacture
摘要 A double-bit non-volatile memory structure and a method of forming the structure. The main body of the structure is an array of double-bit memory cells partitioned out by mutually crossing isolation lines and bit lines. Each memory cell includes a pair of stacked gate structures, a doped region in between the stacked gate structures and a pair of common source/drain regions for the pair of stacked gate structures. Each control gate within the pair of stacked gate structures connects electrically with a neighboring word line and each source/drain region connects electrically with a bit line. To form the structure, a plurality of isolation lines is formed over a substrate and then a plurality of linear multi-layered structures perpendicular to the isolation lines are formed over the isolation lines. A pair of neighboring linear multi-layered structures forms a grid unit. Thereafter, source/drain regions and bit lines are formed between various grid units. A plurality of doped region is formed in the substrate in the middle of each grid unit. The linear multi-layered structures are patterned to form an array of stacked gate structures. Each pair of neighboring stacked gate structures forms a double-bit memory cell. Finally, words lines that are perpendicular to the bit lines are formed over the stacked gate structures.
申请公布号 US2002121657(A1) 申请公布日期 2002.09.05
申请号 US20010797461 申请日期 2001.03.01
申请人 UNITED MICROELECTRONICS CORP. 发明人 CHEN CHIN-YANG
分类号 H01L21/8247;H01L27/115;(IPC1-7):H01L27/115;H01L27/10;H01L27/112;H01L21/336;H01L29/94 主分类号 H01L21/8247
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