发明名称 APPARATUS FOR TESTING TEST MODULE MOUNTED ON PERSONAL COMPUTER
摘要 PURPOSE: An apparatus for testing a test module mounted on a personal computer(PC) is provided to rapidly perform a loading/unloading process regarding a module recognized to be defective in the early stage of a test process, by connecting a PC set and a main controller by a communication port. CONSTITUTION: A rack has receiving spaces composed of n rows and two columns(n is a natural number), wherein the two columns move upward and downward. A transfer rail is installed inside each receiving space. A power supplying bar which supplies power by a contact method, is installed in a side of the transfer rail. The PC set(210) moves back and forth, coupled to the transfer rail installed in each receiving space. The PC set is provided with power, in contact with the power supplying bar and including a parallel test board(212) in which a plurality of test sockets(214) into which a plurality of memory modules can be inserted are installed. The main controller(250) is continuously provided with PC test information of the memory module inserted into the test socket, connected to the PC set by the communication port(260). When an initial defect is generated in the memory module inserted into the test socket or the main controller is provided with specific PC set information having a test result, the apparatus for testing the test module takes only a specific PC set from the rack and classifies the memory module inserted into the specific PC set according to the test result.
申请公布号 KR20020069406(A) 申请公布日期 2002.09.04
申请号 KR20010009658 申请日期 2001.02.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 BYUN, SEONG JIN;PARK, YONG U
分类号 H01L21/66;(IPC1-7):H01L21/66 主分类号 H01L21/66
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