Self-supporting adaptable metrology device

摘要

The invention refers to a metrology device (10) to be coupled to a semiconductor product handling and/or processing tool (1) enclosing a mini-environmental atmosphere, the metrology device comprising a housing (13) preserving an inner atmosphere, a coupling region (14) for connecting the inner atmosphere to the mini-environmental atmosphere and measuring means (19) for measuring the property of a semiconductor product. According to the invention, the metrology device is constructed comprising a support (11, 12) which is movable on the ground by transport means (18) and which is dimensioned such that the metrology device is self-supporting in a position appropriate for quick coupling of the coupling region (14) of the tool (1). The invention allows for quick operational mini-environmental coupling of measurement means of any size and weight to a loadport or other closeable opening of a cluster tool. As a consequence, semiconductor wafers need no longer be transported in FOUPs from one loadport to another for intermediate measurement between two process steps at the same cluster tool. By the present invention, the lack of integration of measuring equipment to processing equipment characterising semiconductor industry by reasons of high integration efforts and costs is overcome.