发明名称 Semiconductor apparatus and method for fabricating the same
摘要 First, a substrate, on which a plurality of semiconductor devices is formed, is provided. Next, a first etching treatment is carried out to the substrate with a first etching gas comprising CF4 to form a base trench having a rounded-off upper edge or tapered upper edge. A second etching treatment is carried out to the substrate to form a trench region at the base trench so that the trench region has a rounded-off upper edge. And then, an insulating layer is formed on the substrate to fill up the trench region therewith.
申请公布号 US6444540(B2) 申请公布日期 2002.09.03
申请号 US20010864201 申请日期 2001.05.25
申请人 OKI ELECTRIC INDUSTRY CO., LTD 发明人 KAWADA SHINZI;KAWANO HIROYUKI
分类号 H01L21/302;H01L21/3065;H01L21/76;H01L21/762;(IPC1-7):H01L21/76 主分类号 H01L21/302
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