发明名称 Semiconductor device and method of fabricating the same
摘要 First and second transistors are formed on the principal surface of the semiconductor substrate, and an insulating film is formed over the principal surface of the semiconductor substrate so as to cover the first and second transistors. A first storage node is connected to the first transistor and has a first enclosed wall structure which is formed over the insulating film and encloses a surface region of the insulating film. A second storage node is connected to the second transistor and has second enclosed wall structure which is formed over the insulating film and surrounds the first enclosed wall structure. A capacitor insulating film covers the first and second enclosed wall structures, and a cell-plate is formed on the capacitor insulating film.
申请公布号 US6445028(B1) 申请公布日期 2002.09.03
申请号 US19990225547 申请日期 1999.01.05
申请人 OKI ELECTRIC INDUSTRY CO., LTD. 发明人 YOSHIDA MASAHIRO;SUZUKI KAZUYA
分类号 H01L21/02;H01L21/8242;H01L27/02;H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L21/02
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