| 摘要 |
An X-ray examination apparatus is provided with a high voltage generator for an X-ray tube and a number of additional power supply units for further components of the X-ray examination apparatus. There is also provided an input circuit which is to be connected to the mains and includes a current measuring circuit; the high-voltage generator and the additional power supply units are connected to the input circuit. The high voltage generator includes a rectifier unit and a power factor correction circuit which is connected thereto and is controlled, via the input circuit, in such a manner that the variation of the current drawn via the rectifier unit, together with that drawn by the additional power supply units collectively, is mainly sinusoidal and in phase with the mains voltage.
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