发明名称 Gate-insulating film including oxide film
摘要 A gate-insulating film of the present invention is a gate-insulating film having a polycrystalline film made of a metal oxide, in which a grain boundary plane extending in parallel with the polycrystalline film is present at the position of a predetermined thickness of the polycrystalline film and grain boundaries extending in the film-thickness direction of polycrystals configuring the polycrystalline film are discontinuous at the grain boundary plane.
申请公布号 US6445033(B1) 申请公布日期 2002.09.03
申请号 US20000609290 申请日期 2000.06.30
申请人 NEC CORPORATION 发明人 HASEGAWA EIJI
分类号 H01L29/78;H01L21/28;H01L21/316;H01L29/51;(IPC1-7):H01L21/822 主分类号 H01L29/78
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