发明名称 Photoelectric position measuring device
摘要 In a position measuring device, a scale is embodied as a phase grating on which several partial beams impinge and are diffracted and caused to interfere with each other in the scanning unit. The entry angle (alpha) of the partial beams corresponds to the Littrow angle, so that the diffracted partial beams of ±1st diffraction order are diffracted at the same angle beta=alpha. The diffraction efficiency of the scale is particularly great if the flanks of the bars of the scales are at an angle of approximately 70° with respect to the measuring direction, i.e., if the bars and gaps are embodied to be trapezoidal in cross section.
申请公布号 US6445456(B2) 申请公布日期 2002.09.03
申请号 US19970991140 申请日期 1997.12.16
申请人 DR. JOHANNAS HEIDENHAIN GMBH 发明人 SPECKBACHER PETER;ALLGAEUER MICHAEL;FLATSCHER GEORG;SAILER ANTON;KERN WALBURGA
分类号 G01B11/00;G01D5/38;G02B5/18;(IPC1-7):G01B9/02 主分类号 G01B11/00
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