发明名称 Laser detection of material thickness
摘要 There is provided a method for measuring material thickness comprising: (a) contacting a surface of a material to be measured with a high intensity short duration laser pulse at a light wavelength which heats the area of contact with the material, thereby creating an acoustical pulse within the material: (b) timing the intervals between deflections in the contacted surface caused by the reverberation of acoustical pulses between the contacted surface and the opposite surface of the material: and (c) determining the thickness of the material by calculating the proportion of the thickness of the material to the measured time intervals between deflections of the contacted surface.
申请公布号 US6445457(B1) 申请公布日期 2002.09.03
申请号 US19990379889 申请日期 1999.08.23
申请人 THE REGENTS OF THE UNIVERSITY OF CALIFORNIA 发明人 EARLY JAMES W.
分类号 G01B11/06;G01B17/02;(IPC1-7):G01B11/06 主分类号 G01B11/06
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