发明名称 |
Laser detection of material thickness |
摘要 |
There is provided a method for measuring material thickness comprising: (a) contacting a surface of a material to be measured with a high intensity short duration laser pulse at a light wavelength which heats the area of contact with the material, thereby creating an acoustical pulse within the material: (b) timing the intervals between deflections in the contacted surface caused by the reverberation of acoustical pulses between the contacted surface and the opposite surface of the material: and (c) determining the thickness of the material by calculating the proportion of the thickness of the material to the measured time intervals between deflections of the contacted surface.
|
申请公布号 |
US6445457(B1) |
申请公布日期 |
2002.09.03 |
申请号 |
US19990379889 |
申请日期 |
1999.08.23 |
申请人 |
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA |
发明人 |
EARLY JAMES W. |
分类号 |
G01B11/06;G01B17/02;(IPC1-7):G01B11/06 |
主分类号 |
G01B11/06 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|