发明名称 METHOD FOR DESIGNING HIGH FREQUENCY CIRCUIT AND INSTRUMENT FOR MEASURING SEMICONDUCTOR HIGH FREQUENCY
摘要 PROBLEM TO BE SOLVED: To accurately design a high frequency circuit at a high designing speed. SOLUTION: The input-output impedance matching of a semiconductor device 1 for high frequency is realized by setting impedance produced by the high frequency circuit simulation of a computer 9 in electronic control impedance matching circuits 7A and 7B. A modulation signal MS1 is generated from a modulation signal source 6 including a digital-analog converter on the basis of a control signal generated by the high frequency simulation by the computer 9 and inputted to the semiconductor device 1 for high frequency through the matching circuit 7A. An output signal from the semiconductor device 1 for high frequency is extracted through the matching circuit 7B and measured by a spectrum analyzer 8 including analog-digital converter. High frequency measured data are fetched to the computer 9 and reflected on the high frequency circuit simulation by the computer 9.
申请公布号 JP2002245107(A) 申请公布日期 2002.08.30
申请号 JP20010038219 申请日期 2001.02.15
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 KANAZAWA KUNIHIKO
分类号 G01R31/316;G06F17/50;(IPC1-7):G06F17/50 主分类号 G01R31/316
代理机构 代理人
主权项
地址