发明名称 |
METHOD FOR DESIGNING HIGH FREQUENCY CIRCUIT AND INSTRUMENT FOR MEASURING SEMICONDUCTOR HIGH FREQUENCY |
摘要 |
PROBLEM TO BE SOLVED: To accurately design a high frequency circuit at a high designing speed. SOLUTION: The input-output impedance matching of a semiconductor device 1 for high frequency is realized by setting impedance produced by the high frequency circuit simulation of a computer 9 in electronic control impedance matching circuits 7A and 7B. A modulation signal MS1 is generated from a modulation signal source 6 including a digital-analog converter on the basis of a control signal generated by the high frequency simulation by the computer 9 and inputted to the semiconductor device 1 for high frequency through the matching circuit 7A. An output signal from the semiconductor device 1 for high frequency is extracted through the matching circuit 7B and measured by a spectrum analyzer 8 including analog-digital converter. High frequency measured data are fetched to the computer 9 and reflected on the high frequency circuit simulation by the computer 9.
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申请公布号 |
JP2002245107(A) |
申请公布日期 |
2002.08.30 |
申请号 |
JP20010038219 |
申请日期 |
2001.02.15 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
KANAZAWA KUNIHIKO |
分类号 |
G01R31/316;G06F17/50;(IPC1-7):G06F17/50 |
主分类号 |
G01R31/316 |
代理机构 |
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地址 |
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