发明名称 |
PROGRAM, DEVICE AND METHOD FOR AUTOMATICALLY MODIFYING ELEMENT MODEL |
摘要 |
PROBLEM TO BE SOLVED: To quickly and accurately check an element model and modify a malfunction place without depending on user skill. SOLUTION: This element model automatic modifying device is provided with a grammar checking part 60 for performing grammar check of the element model on the basis of a check table representing correspondence relation between element model grammar representing electrical characteristics of a semiconductor device and modification ideas in the case of departing from the grammar, and a grammatical error modification idea preparing part 70 for modifying the element model according to a corresponding modification idea when the grammar checking part 70 checks description that departs from the grammar.
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申请公布号 |
JP2002245112(A) |
申请公布日期 |
2002.08.30 |
申请号 |
JP20010042603 |
申请日期 |
2001.02.19 |
申请人 |
FUJITSU LTD |
发明人 |
TOSAKA MASAKI;KARINO TOSHIO;KOIZUMI TAKEO;YONEDA JIRO;NAGATA MEGUMI;ORIHARA HIROYUKI;KAWADA HIKOYUKI |
分类号 |
G06F17/50;H01L29/00;(IPC1-7):G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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